MEMS |
Electrostatic
micromechanical actuator with extended range of travel |
Journal of
Microelectromechanical Systems |
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361K |
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Effect of
surface properties on the effective electrical gap of
electrostatically actuated micromechanical devices operating in contact |
Modeling and
Simulation of Microsystems, San Diego, Mar. 2000 |
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480K |
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Comprehensive
static characterization of vertical electrostatically actuated
polysilicon beams |
IEEE Design
and Test of Computers Magazine, Special Issue on Testing for MEMS,
vol 16 no 4, Oct-Dec 1999 |
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637K |
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Characterization
of contact electromechanics through capacitance voltage measurements
and simulations |
Journal of
Microelectromechanical Systems, vol 8 no 2, Jun 1999 |
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945K |
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Complete
characterization of electrostatically-actuated beams including the
effects of multiple discontinuities and buckling |
Modeling and
Simulation of Microsystems, Puerto Rico, Apr 1999 |
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138K |
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Effects of
capacitors, resistors and residual charges on the static and dynamic
performance of electrostatically-actuated devices |
SPIE
Symposium on Design and Test of MEMS/MOEMS, Paris, Mar 1999 |
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255K |
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Characterization
of electrostatically-actuated beams through capacitance-voltage
measurements and simulations |
Modeling and
Simulation of Microsystems, Santa Clara, Apr 1998 |
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93K |
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Nonlinear
dynamic modeling of micromachined microwave switches |
IEEE
Microwave Theory and Techniques Symposium, Denver, Jun 1997 |
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38K |
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163K |
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Electromagnetics |
Analysis of
crosstalk between striplines using the FDTD method |
Stanford
EE391 report |
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132K |
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Ph.D.
Thesis |
Characterization
and modeling of electrostatically actuated micromechanical devices |
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2780K
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