True Circuits Inc.
rnavid at gloworm . Stanford . edu
Ph.D. Electrical Engineering, Stanford University, Stanford, California (2001- 2005)
M.S. Electrical Engineering, Sharif University of Technology, Tehran, Iran (1996-1998)
B.S. Electrical Engineering, University of Tehran, Tehran, Iran (1992-1996)
R. Navid, T. H. Lee and R. W. Dutton, Circuit-Based Characterization of Device Noise Using Phase Noise Data, IEEE Transactions on Circuits and Systems I, Vol. 57, pp. 1265-1272, June 2010.
T. Chen, J. Chun, Y. Lu, R. Navid, W. Wang, C. Chen; R. Dutton, "Thermal Modeling and Device Noise Properties of Three-DimensionalSOI Technology," IEEE Transactions on Electron Devices, Vol 56, pp. 656 - 664, April 2009.
H. Lee, K. Chang, J. Chun, T. Wu, Y. Frans, B. Leibowitz, N. Nguyen, T. J. Chin, K. Kaviani, J. Shen, X. Shi, W. T. Beyene, S. Li, R. Navid, M. Aleksic, F. S. Lee, F. Quan, J. Zerbe, R. Perego, F. Assaderaghi, "A 16 Gb/s/Link, 64 GB/s Bidirectional Asymmetric Memory Interface," IEEE Journal of Solid-State Circuits, Vol 44, pp. 1235 - 1247, April 2009.
R. Navid, C. Jungemann, T. H. Lee and R. W. Dutton, High-frequency noise in nanoscale metal oxide semiconductor field effect transistors, Journal of Applied Physics, Vol 101(12) , pp. 101-108. June 15, 2007.
A. Hassibi, S. Zahedi, R. Navid, R. W. Dutton and T. H. Lee, "Biological shot-noise and quantum-limited signal-to-noise ratio in affinity-based biosensors," Journal of Applied Physics, Vol 97, April 2005.
R. Navid, T. H. Lee and R. W. Dutton, "Minimum Achievable Phase Noise of RC Oscillators," IEEE Journal of Solid-State Circuits, Vol 40, pp. 630-637, March 2005.
R. Navid, T. H. Lee and R. W. Dutton, "An Analytical Formulation of Phase Noise of Signals with Gaussian-Distributed Jitter," IEEE Transactions on Circuits and Systems II, Vol 52, pp. 149-153, March 2005.
N. Nguyen, Y. Frans, B. Leibowitz, S. Li, R. Navid, M. Aleksic, F. Lee, F. Quan, J. Zerbe, R. Perego and F. Assaderaghi, A 16-Gb/s Differential I/O Cell with 380fs RJ in an Emulated 40nm DRAM Process, IEEE Symposium on VLSI Circuits, June 2008, Honolulu, Hawaii.
T. W. Chen, J. H. Chun, Y. Lu, R. Navid,
W. Wang and R. W. Dutton, Thermal
Modeling and Device Noise Properties of 3D-SOI Technology,
IEEE International SOI Conference, Oct. 2007, Indian Wells, California.
R. Navid, T. H. Lee and R. W. Dutton, A circuit-based noise parameter extraction technique for MOSFETs, IEEE International Symposium on Circuits and Systems (ISCAS), May 2007, New Orleans, Louisiana.
M. Jeeradit, Y. Frans, R. Navid, and B. Garlepp, PLL random jitter estimation using different VCO phase noise simulation methodologies, Synopsys Users Group Conference (SNUG), April 2007, San Jose, California.
R. Navid, C. Jungemann, T. H. Lee and R. W. Dutton, Close-in Phase Noise in Electrical Oscillators, SPIE International Symposium on Fluctuations and Noise, May 2004, Canary Islands, Spain.
A. Hassibi, T. H. Lee, R. Navid, R. W. Dutton, and S. Zahedi, Effects of scaling on the SNR and speed of biosensors, IEEE Engineering in Medicine and Biology Society (EMBS) Annual International Conference, September 2004, San Francisco, California.
S. Zahedi, R. Navid and A. Hassibi, Statistical modeling of biochemical detection systems, IEEE Engineering in Medicine and Biology Society (EMBS) Annual International Conference, September 2004, San Francisco, California.
R. Navid, T. H. Lee and R. W. Dutton, Lumped, Inductorless Oscillators: How Far Can They Go? IEEE Custom Integrated Circuits Conference (CICC), September 2003, San Jose, California.
R. Navid and R. W. Dutton, The Physical Phenomena Responsible for the Excess Noise in Short-Channel MOS Devices, IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), September 2002, Kobe, Japan.