This project is under DARPA NeoCAD program. NeoCAD program is going to deliver a set of completely automated design tools for design of Microsystems with mixed signal (digital and analog) and mixed electronic/photonic circuits. There are more than 10 Universities and Research Institutes involved into this program. Dutton TCAD group in Stanford University is one of NeoCAD research teams. Our goal is to create bi-directional synthesized compact models (SCMs) linking behavior of AMS/RF components with layout. These models will capture essential parasitic effects without requiring explicit model order reduction. Parameterization of the SCMs will be based on technology CAD and will be experimentally verified using test structures.

Rigorous substrate modeling, based on Technology CAD, will be used to capture essential nonlinear and coupling effects unique to a given technology base. Automated extraction of compact model information, including use of harmonic balance (NB) at the device level, will support direct correlation with technology parameters. Test structures based on sub-blocks of practical RF system can provide highly sensitive measurements of noise; calibration and parameterization for supporting the use of bi-directional SCMs can also support synthesis-based design methodology.

 

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