1997 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR
PROCESSES AND DEVICES: SISPAD '97
September 8-10, 1997, Marriott Cambridge,
Cambridge, Massachusetts, USA
Under the sponsorship of the Electron Devices Society of the IEEE, an international conference on the numerical modeling of semiconductor equipment, processes, and devices for integrated circuits will be held in Boston on September 8-10, 1997.
This meeting provides an opportunity for the presentation and discussion of recent advances in modeling and simulation of semiconductor equipment, processes, and devices for increased understanding and for applications to both design and manufacturing. The program consist of 20-minute presentations selected from two-page abstracts. Topics may include semiconductor equipment simulation; process simulation; device modeling and simulation for complex structures; interconnect modeling and simulation; integration of process, device, and circuit simulations; simulation of chemical and physical phenomena; user interfaces or visualization; numerical methods and algorithms for simulations of such devices as microsensors, microactuators, optoelectronic devices, and flat panel displays; and benchmarking, calibration, and verification of simulators.
Deadline for submission of abstracts:
Authors should submit 25 copies of a two-page abstract including figures to:
SISPAD '97 Conference Manager CISX 332 Stanford University Stanford, CA 94305-4075 Phone: (415)723-1349 Fax:(415)725-7731 e-mail: fely@ee.stanford.edu
The abstract should include: (1)title, (2)first author's name and complete mailing address, (3)names and affiliations of additional authors, and (4)electronic mailing address. The Technical Program Committee will consist of four Subcommittees on 1)Processes and Devices, 2)Devices, 3)Applications, and4)Numerics/Interconnects. Authors may suggest for which Subcommittee their abstract is most suitable. Authors will be notified of the Technical Program Committee's decision by May 5, 1997.
Depending on the number of accepted papers, one or more poster sessions may be arranged.
Authors of accepted papers will be instructed on how to prepare a final extended abstract for inclusion in the 1997 SISPAD Proceedings.
Selection Criteria: The degree to which the two-page abstract deals with the following criteria will strongly affect whether the paper is selected: 1) What is the motivation for your paper? 2) What is new or original and how does it differ from previous work? 3) What is its impact or significance? 4) What are the major and specific results?
Additional information: Additional details will be announced when the Advanced Program is distributed and will be posted electronically in the IEEE Journal of Technology Computer-Aided Design.